查詢教學大綱與進度

教學大綱與進度

課程基本資料：

學年期課號課程名稱階段學分時數修教師班級人撤備註

108-2 273371 X光在材料分析上的應用 1 3.0 3 ★ 許益瑞分子二 13 0 需持有「游離輻射訓練合格證書」者，方可選修此課程

學年期	課號	課程名稱	階段	學分	時數	修	教師	班級	人	撤	備註
108-2	273371	X光在材料分析上的應用	1	3.0	3	★	許益瑞	分子二	13	0	需持有「游離輻射訓練合格證書」者，方可選修此課程

教學大綱與進度：

教師姓名許益瑞

Email ijuihsu@ntut.edu.tw

最後更新時間 2019-12-19 11:13:05

課程大綱 X光已經成為材料結構鑑定上一項很有用的技術。這門課將介紹如何應用X光粉末繞射與吸收光譜於材料結構鑑定，以及數據分析。本課程將以Matlab與GSASII軟體教導學生進行數據分析。 X-ray has become a powerful technique on the characterization of material structures. The course will teach how to apply the x-ray diffraction and absorption on structural characterization and even analysis. In the x-ray diffraction part, we will teach the fundamental scattering theory, space group, and basic crystallography. For polycrystalline materials, the Rietveld refinement will be used for powder x-ray diffraction data analysis. For soft mater like polymers, the XRD in combination with molecular modeling will be used to analysis the experimental XRD pattern. In the x-ray absorption part, the EXAFS data analysis method will be used to understand the local environment and bond length between absorbing metal and coordinated ligands. Matlab and GSASII will be used for data analysis.

課程進度 week 1 Introduction to basic scattering theory(I) week 2 Introduction to basic scattering theory(II) week 3 Solid State (I) : crystallography week 4 Solid State (II) : symmetry week 5 Solid State (III) : x-ray diffraction theory(I) week 6 Solid State (IV) : x-ray diffraction theory(II) week 7 Powder X-ray data analysis (I) week 8 Powder X-ray data analysis (II) week 9 Structure Visualization and Molecular Building week 10 Molecular Modeling and XRD analysis on polymer week 11 Small angle x-ray scattering week 12 X-ray absorption Spectroscopy (I) : XANES week 13 X-ray absorption Spectroscopy (II) : EXAFS week 14 EXAFS data analysis week 15 Practical (I) week 16 Practical (II) week 17 Practical (III) week 18 Practical (IV)

評量方式與標準平時 30% 期末 70%

使用教材、參考書目或其他 【遵守智慧財產權觀念，請使用正版教科書，不得使用非法影印教科書】

使用外文原文書：是
1. C. Giacovazzo, H. L. Monaco, D. Viterbo, F. Scordari, G. Gilli, G. Zanotti, M. Catti, Fundamentals of Crystallography, IUCr, Oxford Science Publications, 1992. 2. Leonid V. Azaroff, Elements of X-ray Crystallography 3. Anthony R. West, Basic Solid State Chemistry, John Willey & Sons, Singapore, 1991. 4. M. F. C. Ladd and R. A. Palmer, Structure Determination by X-ray Crystallography, 2nd ed., 1985. 5. Jan Drenth, Principle of Protein X-ray Crystallography, Springer, 1994.

課程諮詢管道

備註

教師姓名	許益瑞
Email	ijuihsu@ntut.edu.tw
最後更新時間	2019-12-19 11:13:05
課程大綱	X光已經成為材料結構鑑定上一項很有用的技術。這門課將介紹如何應用X光粉末繞射與吸收光譜於材料結構鑑定，以及數據分析。本課程將以Matlab與GSASII軟體教導學生進行數據分析。 X-ray has become a powerful technique on the characterization of material structures. The course will teach how to apply the x-ray diffraction and absorption on structural characterization and even analysis. In the x-ray diffraction part, we will teach the fundamental scattering theory, space group, and basic crystallography. For polycrystalline materials, the Rietveld refinement will be used for powder x-ray diffraction data analysis. For soft mater like polymers, the XRD in combination with molecular modeling will be used to analysis the experimental XRD pattern. In the x-ray absorption part, the EXAFS data analysis method will be used to understand the local environment and bond length between absorbing metal and coordinated ligands. Matlab and GSASII will be used for data analysis.
課程進度	week 1 Introduction to basic scattering theory(I) week 2 Introduction to basic scattering theory(II) week 3 Solid State (I) : crystallography week 4 Solid State (II) : symmetry week 5 Solid State (III) : x-ray diffraction theory(I) week 6 Solid State (IV) : x-ray diffraction theory(II) week 7 Powder X-ray data analysis (I) week 8 Powder X-ray data analysis (II) week 9 Structure Visualization and Molecular Building week 10 Molecular Modeling and XRD analysis on polymer week 11 Small angle x-ray scattering week 12 X-ray absorption Spectroscopy (I) : XANES week 13 X-ray absorption Spectroscopy (II) : EXAFS week 14 EXAFS data analysis week 15 Practical (I) week 16 Practical (II) week 17 Practical (III) week 18 Practical (IV)
評量方式與標準	平時 30% 期末 70%
使用教材、參考書目或其他	【遵守智慧財產權觀念，請使用正版教科書，不得使用非法影印教科書】使用外文原文書：是 1. C. Giacovazzo, H. L. Monaco, D. Viterbo, F. Scordari, G. Gilli, G. Zanotti, M. Catti, Fundamentals of Crystallography, IUCr, Oxford Science Publications, 1992. 2. Leonid V. Azaroff, Elements of X-ray Crystallography 3. Anthony R. West, Basic Solid State Chemistry, John Willey & Sons, Singapore, 1991. 4. M. F. C. Ladd and R. A. Palmer, Structure Determination by X-ray Crystallography, 2nd ed., 1985. 5. Jan Drenth, Principle of Protein X-ray Crystallography, Springer, 1994.
課程諮詢管道
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