課程編碼
Course Code
中文課程名稱
Course Name (Chinese)
英文課程名稱
Course Name (English)
總學分數
Credits
總時數
Hours
A405124 專利審查基準 The Benchmark of Patent examination 3.0 3
中文概述
Chinese Description
本課程將以智慧財產局頒布之「專利審查基準」為藍本,依「先程序後實體」原則先就「程序審查」部分介紹專利申請之程式,再就專利申請之「實體審查」部分依序說明專利說明書暨圖式之構成、可專利類型、產業利用性、新穎性、進步性等專利要件,先申請原則、發明單一性、優先權、說明書及圖式之修正、分割申請及改請申請,以及專利權期間延長。
英文概述
English Description
This course is to introduce the formality examination and the substantive examination based upon the "Patent Examination Guideline" issued by the TIPO, including the formality of the patent application, and the, utility, novelty, inventive steps, first-to-file, priority claim, amendment, divisional application, and the extension of patent term and so on.
核心能力指標 A.對智財相關議題之認知力
B.對特定智財議題深入了解之能力
D.撰寫中英文論文及智財文件之能力
F.重要國家考試參與能力

備註: