| 課程編碼 Course Code | 中文課程名稱 Course Name (Chinese) | 英文課程名稱 Course Name (English) | 總學分數 Credits | 總時數 Hours |
|---|---|---|---|---|
| 9100155 | 專利審查基準(1) | The Benchmark of Patent examination | 2.0 | 2 |
| 中文概述 Chinese Description | 本課程將以智慧財產局頒布之「專利審查基準」為藍本，依「先程序後實體」原則先就「程序審查」部分介紹專利申請之程序，再就專利申請之「實體審查」部分依序說明專利說明書暨圖式之構成、可專利類型、產業利用性、新穎性、進步性等專利要件，先申請原則、發明單一性及優先權。 | |||
| 英文概述 English Description | This course will be based on the "Patent Examination Guidelines" issued by the Taiwan Intellectual Property Office, and introduces the procedure for patent application according to the principle of "formality before substantive examination". Firstly, in the "formality examination" section, topics such as the constitution of a patent specification and drawings, the allowable subject matter for patents, utility, novelty, inventiveness and other patent elements, the first-to-file rule, unity of invention, and the priority of an patent application, will be sequentially discussed. | |||
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