課 程 概 述
Course Description

課程編碼
Course Code
中文課程名稱
Course Name (Chinese)
英文課程名稱
Course Name (English)
總學分數
Credits
總時數
Hours
7815189 材料分析 Characterization of Materials 3.0 3
中文概述
Chinese Description
本「材料分析」課程主要建構於晶體繞射學、顯微術、光譜學三大基礎原理,旨在闡釋固態材料內部與表面的晶體結構、顯微結構和化學成分之分析技術。現代科技探究精密、準確與高解析度,本課程逐步精要剖析X光繞射儀、各式光學和電子顯微鏡、掃描探針顯微鏡、歐傑電子能譜儀、二次離子質譜儀、核磁共振波譜儀、各式光譜儀,以及其他如熱分析、同步輻射與中子分析等分析儀器,特別應用案例解析與討論,以增進對先進新穎材料的認識,使學生得以了解並深入各種常見材料分析的原理、方法及其應用。
英文概述
English Description
This "characterization of materials" course is mainly based on three fundamental principles of crystal diffractometry, microscopy and spectroscopy; and aims to illustrate the characterization techniques of crystal structure, microstructure and chemical composition inside and on the surface of solid materials. Exploring precision, accuracy and high resolution of modern science and technology, this course gradually analyzes X-ray diffractometer, various optical and electron microscopy, scanning probe microscope, AES, XPS, SIMS, NMR, all kinds of spectrometers, as well as other analytical instruments such as thermal analysis, synchrotron radiation and neutron analyses. Special application case study and discussion are provided to enhance the understanding of advanced and novel materials, so that students can know well and fully utilize a variety of important materials analysis technique and their principles, methodology and proper applications.

備註:

  1. 本資料係由本校各教學單位、教務處課務組、進修部教務組、進修學院教務組及計網中心所共同提供!
  2. 本資料僅供參考,正式資料仍以教務處、進修部、進修學院所公佈之書面資料為準。