| 課程編碼 Course Code | 中文課程名稱 Course Name (Chinese) | 英文課程名稱 Course Name (English) | 總學分數 Credits | 總時數 Hours |
|---|---|---|---|---|
| 6505041 | 半導體材料與元件檢測技術 | Semiconductor Materials and Devices Characterizations | 3.0 | 3 |
| 中文概述 Chinese Description | 1.結構分析2.光學特性分析3.時析光學特性量測4.電性分析5.載子活期與移動率分析6.光電元件分析 | |||
| 英文概述 English Description | 1.Structural AnalysisSEM, TEM, SIMS, AES, X-ray diffractrometry, STM2.Optical ConstantsOptical Microscopy, Ellipsometry, FTIR, CWPR, PL3.Time-Resolved Optical MeasurementsTRPR, TRPL, Pump-Probe, EOS, PCS4. ElectricalI-V, C-V, resistance/resistivity, Hall measurements, defects5. Carrier Lifetimes and Mobility6. Characterization of Photonic DevicesPhotodetectors (PD), Optical Modulators (EAM), Laser Diodes (LD) | |||
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