| 課程編碼 Course Code | 中文課程名稱 Course Name (Chinese) | 英文課程名稱 Course Name (English) | 總學分數 Credits | 總時數 Hours |
|---|---|---|---|---|
| 6505029 | 電子顯微鏡及應用 | Application of Scanning Electronic Microscopy | 3.0 | 3 |
| 中文概述 Chinese Description | 先修課程：負責教授同意。 掃瞄式電子顯微鏡（Scanning Electron Microscopy, SEM）是利用入射電子束與試片產生的二次電子或背向散射電子等來成像之一種表面形貌檢測技術。如果配備其它檢測器亦可做為成分分析，材料相結構的探討等。對於光電元件，半導體元件的分析是相有利的工具，因此這門課對於元件製作的同學而言，相當實用。 | |||
| 英文概述 English Description | Scanning electron microscopy has now become an important established method for the characterization, surfacing morphology analysis of materials. It is an available, very useful, very powerful tool on the analysis and characterization of optical elements, semi-conductor elements etc. The course deals with these concepts, so it is necessary to prepare for these students whom being fabricating these elements. | |||
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