課 程 概 述
Course Description

課程編碼
Course Code
中文課程名稱
Course Name (Chinese)
英文課程名稱
Course Name (English)
總學分數
Credits
總時數
Hours
3645004 數位電路測試與可測性設計 Digital Circuit Testing and DFT 3.0 3
中文概述
Chinese Description
說明數位電路測試與可測性之理論和技術,介紹失效與故障及教障模型。敘述自動測試圖型生成技術,包含布爾差分法、D演算法、PODEM、FAN、臨界通路等方法。討論故障模擬相關技術,如並行故障模擬、演譯故障模擬與同時故障模擬等。重點闡述可測性設計概念,包括特定設計技巧、掃描通路技巧、電平敏感掃描設計、邊界掃描技巧與IEEE1149.1標準及內建自測等方法。
英文概述
English Description
Discuss the theorems and techniques of the Digital Circuit Testing and Design for Testability(DFT). Introduces Failures and Faults, Modeling of Fault.Describes Automatic Test Patterm Generation techniques which include Boolean Difference, D-Algorithm, PODEM (Path-Oriented Decision-Marking), FAN(Fanout-Oriented Test Generation) and Critical Path. Introduces Fault Simulation methods like Parallel Fault Simulation, Deductive Fault Simulation and oncurrent Fault Simluation. Presents the basic concepts and main techniques used in Design for Testability are Ad Hoc techniques, Scan Path Design, LSSD(Level-Sensitive Scan Design) techniques, Boundary Scan with IEEE 1149.1 Standard and BIST(Built-in Self-Test).

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