| 課程編碼 Course Code | 中文課程名稱 Course Name (Chinese) | 英文課程名稱 Course Name (English) | 總學分數 Credits | 總時數 Hours |
|---|---|---|---|---|
| 3203068 | 表面科學與分析 | Surface Science and Analysis | 3.0 | 3 |
| 中文概述 Chinese Description | 本課程目的在介紹微觀之固體表面結構與現象，及現代表面分析技術與應用。課程內容包括微觀之固體表面結構，固體表面之吸附、擴散、脫附現象，表面偏析現象，分子和表面間之鍵結，表面反應的熱力學與動力學，以及各種利用光子、電子、原子、或離子與材料表面的物理或化學作用，來獲得有關材料表面的組成、結構、電子組態、化學鍵結與表面形貌等訊息的材料表面分析技術。所要介紹的表面分析方法包括：真空技術、歐傑電子能譜法（AES）、X-光光電子能譜法(XPS)、二次離子質譜法(SIMS)、低能電子繞射法(LEED)、掃描式電子顯微術(SEM)、掃描式電子穿隧顯微術(STM)、原子力顯微術(AFM)、表面振動光譜法、及程式控溫脫附法(TPD)。 | |||
| 英文概述 English Description | This course is designated to acquaint the student with atomic-level understanding of surface structure, surface phenomena and various modern surface analysis techniques. The first part of the course focuses on the properties of the solid-gas and solid-vacuum interfaces because most of the results of modern surface-science studies on the atomic level come from the scrutiny of these interfaces. It contains the following topics: the atomic-level structure of clean and adsorbate-covered surfaces, adsorption and desorption, surface diffusion, surface segregation, the nature of the surface bonding, the adsorbate-adsorbate interaction, energy transfer during gas-surface interactions and surface reaction. The second part of the course introduces various surface analysis methods, including vacuum technology, Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), Secondary Ion Mass Spectroscopy (SIMS) Low Energy Electron Diffraction (LEED), Scanning Electron Microscopy (SEM), | |||
備註：