Course Syllabus

Course Information：

Year-Semester Course Number Course Name Phase Credits Hours Required/Elective Instructor Class Student NO. Withdraw Note

Spring Semester
Year 2025 343057 Materials and Surface Analysis 1 3.0 3 ★ Chia-Cheng Lin GMRE 11 0 　

Year-Semester	Course Number	Course Name	Phase	Credits	Hours	Required/Elective	Instructor	Class	Student NO.	Withdraw	Note
Spring Semester Year 2025	343057	Materials and Surface Analysis	1	3.0	3	★	Chia-Cheng Lin	GMRE	11	0

Course Plan：

Instructor Chia-Cheng Lin　Office Hours

Email johncclin@ntut.edu.tw

Last Updated 2024-12-17 09:29:38

Course Objective 此課程將介紹各種近代材料分析技術，特別著重於表面分析上。修課後，學生將了解各種技術的基本原理並可選擇適當的方法去作樣品影像表面以及材料分析，同時可比較各方法優缺以及其限制。課程討論之技術主要基於樣品與光子或電子之間的交互作用。 The aim of the course is to introduce modern techniques for materials characterization, especially on surface characterization. After completing the course, the students would be able to understand and choose appropriate instrumentation for imaging and materials analysis by comparing the performance and limitation of different methods for a given situation. Techniques involved in photon and electron interactions with matter would be discussed in this course.

Course Schedule 1. LIGHT MICROSCOPY 2. X-RAY DIFFRACTION METHODS 3. TRANSMISSION ELECTRON MICROSCOPY 4. SCANNING ELECTRON MICROSCOPY 5. SCANNING PROBE MICROSCOPY 6. X-RAY SPECTROSCOPY FOR ELEMENTAL ANALYSIS 7. ELECTRON SPECTROSCOPY FOR SURFACE ANALYSIS 8. SECONDARY ION MASS SPECTROMETRY FOR SURFACE ANALYSIS 9. VIBRATIONAL SPECTROSCOPY FOR MOLECULAR ANALYSIS 10. THERMAL ANALYSIS

Evaluation and grading policy midterm exam 30% final exam 40% group report 30%

Materials All right reserved. Do not reproduce without permission.

Foreign-language textbooks:Yes
Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, 2nd Edition

The access to curricular consultation office hour

The course corresponds to the SDGs 無（None）

Note
　

Instructor	Chia-Cheng Lin　Office Hours
Email	johncclin@ntut.edu.tw
Last Updated	2024-12-17 09:29:38
Course Objective	此課程將介紹各種近代材料分析技術，特別著重於表面分析上。修課後，學生將了解各種技術的基本原理並可選擇適當的方法去作樣品影像表面以及材料分析，同時可比較各方法優缺以及其限制。課程討論之技術主要基於樣品與光子或電子之間的交互作用。 The aim of the course is to introduce modern techniques for materials characterization, especially on surface characterization. After completing the course, the students would be able to understand and choose appropriate instrumentation for imaging and materials analysis by comparing the performance and limitation of different methods for a given situation. Techniques involved in photon and electron interactions with matter would be discussed in this course.
Course Schedule	1. LIGHT MICROSCOPY 2. X-RAY DIFFRACTION METHODS 3. TRANSMISSION ELECTRON MICROSCOPY 4. SCANNING ELECTRON MICROSCOPY 5. SCANNING PROBE MICROSCOPY 6. X-RAY SPECTROSCOPY FOR ELEMENTAL ANALYSIS 7. ELECTRON SPECTROSCOPY FOR SURFACE ANALYSIS 8. SECONDARY ION MASS SPECTROMETRY FOR SURFACE ANALYSIS 9. VIBRATIONAL SPECTROSCOPY FOR MOLECULAR ANALYSIS 10. THERMAL ANALYSIS
Evaluation and grading policy	midterm exam 30% final exam 40% group report 30%
Materials	All right reserved. Do not reproduce without permission. Foreign-language textbooks:Yes Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, 2nd Edition
The access to curricular consultation	office hour
The course corresponds to the SDGs	無（None）
Note