Course Syllabus

Course Information：

Year-Semester Course Number Course Name Phase Credits Hours Required/Elective Instructor Class Student NO. Withdraw Note

Fall Semester
Year 2025 350252 Electron Microscopy 1 3.0 3 ★ YU-CHUAN WU GMMR
半導體學位學程 80 5 材料所和創新半導體合開

Year-Semester	Course Number	Course Name	Phase	Credits	Hours	Required/Elective	Instructor	Class	Student NO.	Withdraw	Note
Fall Semester Year 2025	350252	Electron Microscopy	1	3.0	3	★	YU-CHUAN WU	GMMR 半導體學位學程	80	5	材料所和創新半導體合開

Course Plan：

Instructor YU-CHUAN WU　Office Hours

Email wuyc@ntut.edu.tw

Last Updated 2025-05-23 20:57:21

Course Objective 1.電子光學簡介 2.穿透式電子顯微鏡之結構與成像原理 3.電子繞射理論 4.電子繞射圖型及缺陷分析方法 5.掃瞄式電子顯微鏡之結構與成像原理 6. EDS及WDS之X光光譜分析

Course Schedule 週次授課內容要項 1 1.Microscopy with light and electrons 2 1.Microscopy with light and electrons 3 2.Electrons and their interaction with the specimen 4 2.Electrons and their interaction with the specimen 6 3.Electron diffraction 7 3.Electron diffraction 8 3.Electron diffraction 9 期中考試 10 4.The transmission electron microscope 11 4.The transmission electron microscope 12 4.The transmission electron microscope 13 5.The scanning electron microscope 14 5.The scanning electron microscope 15 5.The scanning electron microscope 16 6.Chemical analysis in the electron microscope 17 6.Chemical analysis in the electron microscope 18 期末考試

Evaluation and grading policy 紙本考試1 (30%) 紙本考試2 (30%) 紙本考試3 (20%) 出席(20%)

Materials All right reserved. Do not reproduce without permission.

Foreign-language textbooks:Yes
教科書名 Electron microscopy and analysis 作者J. Goodhew et al. 出版書局 Taylor & Francis 出版日期西元2001年以上內容，授課老師有權修改上課進度及評量方式

The access to curricular consultation 如有任何問題，請e-mail至wuyc@ntut.edu.tw

Expanding teaching and resources

The course corresponds to the SDGs SDG9：產業創新與基礎設施（Industry, Innovation and Infrastructure）

Does the course incorporate AI ● 無（None）

Note
遠距以teams為主

Instructor	YU-CHUAN WU　Office Hours
Email	wuyc@ntut.edu.tw
Last Updated	2025-05-23 20:57:21
Course Objective	1.電子光學簡介 2.穿透式電子顯微鏡之結構與成像原理 3.電子繞射理論 4.電子繞射圖型及缺陷分析方法 5.掃瞄式電子顯微鏡之結構與成像原理 6. EDS及WDS之X光光譜分析
Course Schedule	週次授課內容要項 1 1.Microscopy with light and electrons 2 1.Microscopy with light and electrons 3 2.Electrons and their interaction with the specimen 4 2.Electrons and their interaction with the specimen 6 3.Electron diffraction 7 3.Electron diffraction 8 3.Electron diffraction 9 期中考試 10 4.The transmission electron microscope 11 4.The transmission electron microscope 12 4.The transmission electron microscope 13 5.The scanning electron microscope 14 5.The scanning electron microscope 15 5.The scanning electron microscope 16 6.Chemical analysis in the electron microscope 17 6.Chemical analysis in the electron microscope 18 期末考試
Evaluation and grading policy	紙本考試1 (30%) 紙本考試2 (30%) 紙本考試3 (20%) 出席(20%)
Materials	All right reserved. Do not reproduce without permission. Foreign-language textbooks:Yes 教科書名 Electron microscopy and analysis 作者J. Goodhew et al. 出版書局 Taylor & Francis 出版日期西元2001年以上內容，授課老師有權修改上課進度及評量方式
The access to curricular consultation	如有任何問題，請e-mail至wuyc@ntut.edu.tw
Expanding teaching and resources
The course corresponds to the SDGs	SDG9：產業創新與基礎設施（Industry, Innovation and Infrastructure）
Does the course incorporate AI	● 無（None）
Note	遠距以teams為主