Course Description

Course CodeCourse NameCreditsHours
A000020 Characterization Methods for Semiconductor and Optoelectronic Materials 3.0 3
Description This course will present the semiconductor and optoelectronic materials-based analysis techniques and their corresponding theories on the surface property measurements including chemical information, stress analysis, morphology, crystalline structure and intermolecular forces between interfaces. The course also includes a practical training on the FTIR microscope, atomic force microscope, reology meter on the semiconductor materials.