| Course Code | Course Name | Credits | Hours |
|---|---|---|---|
| A000020 | Characterization Methods for Semiconductor and Optoelectronic Materials | 3.0 | 3 |
| Description | This course will present the semiconductor and optoelectronic materials-based analysis techniques and their corresponding theories on the surface property measurements including chemical information, stress analysis, morphology, crystalline structure and intermolecular forces between interfaces. The course also includes a practical training on the FTIR microscope, atomic force microscope, reology meter on the semiconductor materials. | ||