| Description
| This "characterization of materials" course is mainly based on three fundamental principles of crystal diffractometry, microscopy and spectroscopy; and aims to illustrate the characterization techniques of crystal structure, microstructure and chemical composition inside and on the surface of solid materials. Exploring precision, accuracy and high resolution of modern science and technology, this course gradually analyzes X-ray diffractometer, various optical and electron microscopy, scanning probe microscope, AES, XPS, SIMS, NMR, all kinds of spectrometers, as well as other analytical instruments such as thermal analysis, synchrotron radiation and neutron analyses. Special application case study and discussion are provided to enhance the understanding of advanced and novel materials, so that students can know well and fully utilize a variety of important materials analysis technique and their principles, methodology and proper applications.
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