| Description
| This course will present the techniques and their corresponding theories on the surface property measurements including chemical information, stress analysis, morphology, crystalline structure and intermolecular forces between interfaces. The course also includes a practical training on the Raman/FTIR microscope, atomic force microscope, x-ray photoelectric spectrometer. Furthermore, instruments to measure crystalline, micro-mechanical, and electrical properties specifically for semiconductor materials will also be introduced.
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