Course Description

Course CodeCourse NameCreditsHours
7305027 Characterization Methods for Semiconductor Materials 3.0 3
Description This course will present the techniques and their corresponding theories on the surface property measurements including chemical information, stress analysis, morphology, crystalline structure and intermolecular forces between interfaces. The course also includes a practical training on the FTIR microscope, atomic force microscope, reology meter on the semiconductor materials.