| Description
| Surface phenomena and processes occurring at interface are becoming inceasingly importamt in a wide variety of industrial applications including the areas of films coating surface treatments, conclusion, triobology, microelectronics, sensors and semi-conductor technologies. Accompanyind this is an ever-growing need for surface characterization allowing better difinition of processes occurring at a microscopic level. Surface analysis is the use of vibration, electron orion spectroscopic and microscopic techniques for the study of material at the atomic level, it includes SEM,AFM,XRD,EDX,ESCA,XPS,AES,Raman Spectrum,and FTIR analysis.
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