| Course Code | Course Name | Credits | Hours |
|---|---|---|---|
| 6505041 | Semiconductor Materials and Devices Characterizations | 3.0 | 3 |
| Description | 1.Structural AnalysisSEM, TEM, SIMS, AES, X-ray diffractrometry, STM2.Optical ConstantsOptical Microscopy, Ellipsometry, FTIR, CWPR, PL3.Time-Resolved Optical MeasurementsTRPR, TRPL, Pump-Probe, EOS, PCS4. ElectricalI-V, C-V, resistance/resistivity, Hall measurements, defects5. Carrier Lifetimes and Mobility6. Characterization of Photonic DevicesPhotodetectors (PD), Optical Modulators (EAM), Laser Diodes (LD) | ||