Course Description

Course CodeCourse NameCreditsHours
6505029 Application of Scanning Electronic Microscopy 3.0 3
Description Scanning electron microscopy has now become an important established method for the characterization, surfacing morphology analysis of materials. It is an available, very useful, very powerful tool on the analysis and characterization of optical elements, semi-conductor elements etc. The course deals with these concepts, so it is necessary to prepare for these students whom being fabricating these elements.