Course Code | Course Name | Credits | Hours |
---|---|---|---|
4006006 | CMOS Device Measurement and Reliability Engineering | 3.0 | 3 |
Description | Introduction, semiconductor materials, quantum effect, passive devices, characteristics of passive devices, active devices, characteristics of active devices, parameters of active devices, pattern designs., parameter extraction, oxide reliability analysis, hot carrier effect, metal migration analysis, product reliability analysis (including ESD protection). |