Course Description

Course CodeCourse NameCreditsHours
4005037 Surface Analysis 3.0 3
Description Surface phenomena and processes occurring at interface are becoming increasingly important in a wide variety of industrial applications including the areas of films coating surface treatments, conclusion, tribology, microelectronics, sensors and semi-conductor technologies. Accompanying this is an ever-growing need for surface characterization allowing better definition of processes occurring at a microscopic level. Surface analysis is the use of vibration, electron or ion spectroscopic and microscopic techniques for the study of material at the atomic level, it includes SEM, AFM, XRD, EDX, ESCA, XPS, AES, Raman Spectrum, and FTIR analysis.