| Description
| This course develops students' expertise in semiconductor materials characterization and analysis. Topics include semiconductor physics fundamentals, crystal structures and defect analysis, electronic band theory, and carrier transport mechanisms. Emphasis on advanced analytical techniques including X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and spectroscopic methods (XPS, AES, FTIR). Students learn instrument operation and data interpretation through hands-on experience. Case studies cover silicon, compound semiconductors, and emerging 2D materials for process monitoring and quality assessment, preparing students for careers in semiconductor industry with essential materials analysis and problem-solving skills.
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