| 課程編碼 Course Code | 中文課程名稱 Course Name (Chinese) | 英文課程名稱 Course Name (English) | 總學分數 Credits | 總時數 Hours |
|---|---|---|---|---|
| AAA0002 | 里特費爾法在X光繞射之解析 | Rietveld refinement analysis on x-ray powder diffraction data | 1.0 | 1 |
| 中文概述 Chinese Description | 無論在學界或業界，X光粉末繞射實驗廣泛被應用於各種材料結構的鑑定．然而，若要更近一步解析材料的結構與應力，則有賴套用Rietveld精算法，才可以從中萃取出更多的結構資訊。本課程以介紹Rietveld 精算法，並強調實際操作學習進行數據分析為主，以期使學生能在短期密集課程中，學會此方法。本課程將涵蓋以下四大部分: 1. 基礎結晶學介紹 2. 基本X光粉末繞射原理與實驗介紹 3. Rietveld 精算方法介紹 4. Rietveld 法之數據解析實作 | |||
| 英文概述 English Description | Powder x-ray diffraction experiment has been widely used to characterize the structure of many materials in academic or industrial field. In order to extract more structural information and strain, it is necessary to apply Rietveld refinement on the experimental data. This course will emphasize on the introduction and practice of Rietveld refinement, and is divided into the following four topics. 1. Introduction to basic crystallography 2. Basic principle and experiments of powder x-ray diffraction 3. Introduction to Rietveld refinement 4. Data analysis and practice of Rietveld refinement | |||
備註：