課程編碼 Course Code | 中文課程名稱 Course Name (Chinese) | 英文課程名稱 Course Name (English) | 總學分數 Credits | 總時數 Hours |
---|---|---|---|---|
A000020 | 半導體和光電材料分析方法 | Characterization Methods for Semiconductor and Optoelectronic Materials | 3.0 | 3 |
中文概述 Chinese Description | 本課程將探討半導體材料和光電材料之之分析方法及技巧、以及界面和分子間引力之量測方法、表面形態分析、晶相結構分析以及電磁性質量測之技術和其原理。並配合半導體旋轉塗佈機和濺鍍機所備製之薄膜﹐實際操作FTIR顯微鏡、原子力顯微鏡、微量材料流變儀。 | |||
英文概述 English Description | This course will present the semiconductor and optoelectronic materials-based analysis techniques and their corresponding theories on the surface property measurements including chemical information, stress analysis, morphology, crystalline structure and intermolecular forces between interfaces. The course also includes a practical training on the FTIR microscope, atomic force microscope, reology meter on the semiconductor materials. |
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