課 程 概 述
Course Description

課程編碼
Course Code
中文課程名稱
Course Name (Chinese)
英文課程名稱
Course Name (English)
總學分數
Credits
總時數
Hours
3203068 表面科學與分析 Surface Science and Analysis 3.0 3
中文概述
Chinese Description
本課程目的在介紹微觀之固體表面結構與現象,及現代表面分析技術與應用。課程內容包括微觀之固體表面結構,固體表面之吸附、擴散、脫附現象,表面偏析現象,分子和表面間之鍵結,表面反應的熱力學與動力學,以及各種利用光子、電子、原子、或離子與材料表面的物理或化學作用,來獲得有關材料表面的組成、結構、電子組態、化學鍵結與表面形貌等訊息的材料表面分析技術。所要介紹的表面分析方法包括:真空技術、歐傑電子能譜法(AES)、X-光光電子能譜法(XPS)、二次離子質譜法(SIMS)、低能電子繞射法(LEED)、掃描式電子顯微術(SEM)、掃描式電子穿隧顯微術(STM)、原子力顯微術(AFM)、表面振動光譜法、及程式控溫脫附法(TPD)。
英文概述
English Description
This course is designated to acquaint the student with atomic-level understanding of surface structure, surface phenomena and various modern surface analysis techniques. The first part of the course focuses on the properties of the solid-gas and solid-vacuum interfaces because most of the results of modern surface-science studies on the atomic level come from the scrutiny of these interfaces. It contains the following topics: the atomic-level structure of clean and adsorbate-covered surfaces, adsorption and desorption, surface diffusion, surface segregation, the nature of the surface bonding, the adsorbate-adsorbate interaction, energy transfer during gas-surface interactions and surface reaction. The second part of the course introduces various surface analysis methods, including vacuum technology, Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), Secondary Ion Mass Spectroscopy (SIMS) Low Energy Electron Diffraction (LEED), Scanning Electron Microscopy (SEM),

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